MR                          

First Name               Maria

Last Name                 Rudnaya

Birth                   20.11.1984                       

 

Nationality              Russian

Lives in                  The Netherlands

 

Phone                     +31-6-818-33-128

Email Address            maria.rudnaya@gmail.com

 

 

 

 

 

 

I got PhD degree in Applied Mathematics in Eindhoven University of Technology.

This page summarizes links and materials related to my scientific work.

 

 

 

 

PhD Thesis

 

Automated focusing and astigmatism correction in electron microscopy

ISBN 978-90-386-2610-9 >>

 

 

 

Journal articles

 

M.E. Rudnaya, R.M. Ochshorn

Sharpness functions for computational aesthetics and image sublimation

IAENG International Journal of Computer Science, 38(4):359-367, 2011 >>

 

M.E. Rudnaya, H.G. ter Morsche, J.M.L. Maubach, R.M.M. Mattheij

A derivative-based fast autofocus method in electron microscopy

Journal of Mathematical Imaging and Vision, accepted, 2011 >>

 

M.E. Rudnaya, W. Van den Broek, R.M.P. Doornbos, R.M.M. Mattheij, J.M.L. Maubach

Autofocus and twofold astigmatism correction in HAADF-STEM

Ultramicroscopy, 111:1043–1054, 2011 >>

 

M.E. Rudnaya, R.M.M. Mattheij, J.M.L. Maubach, H.G. ter Morsche

Orientation identification of the power spectrum

Optical Engineering, 50(103201):1-13, 2011 >>

 

K. Kumar, M. Pisarenco, M. Rudnaya, V. Savcenco, S. Srivastava

Shape reconstruction techniques for optical sectioning of arbitrary objects

Mathematics–in–Industry Case Studies J., 3:19–36, 2011 >>

 

M.E. Rudnaya, R.M.M. Mattheij, J.M.L. Maubach

Evaluating sharpness functions for automated scanning electron microscopy

Journal of Microscopy, 240:38-49, 2010 >>

 

M. Rudnaya, W. Van den Broek, R. Doornbos, S. Kho, R. Mattheij, J. Maubach

A New Method for Defocus and Astigmatism Correction in Electron Microscopy

Microscopy and Microanalysis, 17 (Suppl. 2) 528-529 >>

 

M.E. Rudnaya, R.M.M. Mattheij, J.M.L. Maubach

Iterative autofocus algorithms for scanning electron microscopy

Microscopy and Microanalysis, 15(Suppl 2):1108–1109, 2009 >>

 

 

 

Conference proceedings

 

M.E. Rudnaya, R.M.M. Mattheij, J.M.L. Maubach, H.G. ter Morsche

Autocorrelation-based sharpness functions

3rd IEEE International Conference on Signal Processing Systems, Yantai, China, 2011

 

M.E. Rudnaya, R.M.M. Mattheij, J.M.L. Maubach, H.G. ter Morsche

Gradient-based sharpness function

International Conference of Applied and Engineering Mathematics, volume 1, pages 301–306, London, UK, 2011 >>

 

M.E. Rudnaya, S.C. Kho, R.M.M. Mattheij, J.M.L. Maubach

Derivative-free optimization for autofocus and astigmatism correction in electron microscopy

2nd International Conference on Engineering Optimization, Lisbon, Portugal, 2010 >>

 

A. Thornton, T. Wienhart, O. Bokhove, B. Zhang, K. Kumar, M. Pisarenco, M. Rudnaya,

V. Savcenco, J. Rademacher, J. Zijlstra, A. Szabelska, M. Van der Schans, V. Timperio, F. Veerman

Modeling and optimization of algae groth

72nd European study group Mathematics with industry, pages 54–85, Amsterdam, The Nethelands, 2010 [Proceedings]

 

F. Schilder, R. Christensen, J. Sylvest, K. Kumar, M. Rudnaya, V. Savcenco, B. Sobiegraj, C. Please, R. Style

Design parameters for a siphon system

Proceedings of 76th European Study Group with Industry, Lyngby, Denmark, 2010 [Preprint]

 

M.E. Rudnaya, J.M.L. Maubach, R.M.M. Mattheij

Scanning electron microscopy: Power spectrum analysis

9th Multinational Conference on Microscopy, pages 185–186, Graz, Austria, 2009 >>

 

 

 

Technical reports and industrial presentations

 

K. Kumar, M. Pisarenco, M. Rudnaya, V. Savcenco

Analysis, numerics, and optimization of algae growth

CASA-Report 10-74, Eindhoven University of Technology, 2010 [Download]

 

W. Doornbos, R. Van den Broek, M. Rudnaya, D. Langsweirdt, N. Venema.

Automation of a FEI electron microscope

Embedded Systems Institute symposium, pages 60–61, Eindhoven, The Netherlands, 2009

[Download the proceedings]

 

M.Rudnaya

Autofocus algorithms in electron microscopy

Embedded Systems Institute symposium, pages 76–77, Eindhoven, The Netherlands, 2008

[Download the proceedings]

 

 

 

Awards

 

2011 - Best Student Paper Award at International Conference of Applied Mathematics and Engineering

2011 - Presidential Student Award from Microscopy Society of America (MSA)

 

 

 

Teaching

 

2N460 – Scientific Computing (2010)

2DL04 - Calculus A, pre-master program (2008-2009)

6BP00 – Numerical programming

 

 

 

Links

 

TU/e   – personal webpage

CASA   - Centre for Analysis, Scientific computing and Applications

Condor – The Condor project: System performance and evolvability

 

Evgenii Rudnyi

Model Reduction

 

For my photography and art projects visit http://masharu.nl

 

Photos

 

060911 7 060911 9

 

Phd defense, September 2011, photos by TU/e

 

 

DSC_0073

 

Conference in Signal Processing, Yantai, China 2011

Photo by Jane